SEM3200 Tungsten Filament Scanning Electron Microscope
Manufacturer: CIQTEK
Product Code: SEM3200
- Description
- Size Guide
Description
SEM3200 Tungsten Filament Scanning Electron Microscope
Description of SEM3200 Tungsten Filament Scanning Electron Microscope
CIQTEK SEM3200 is a high-performance tungsten filament scanning electron microscope. It has excellent image quality, low vacuum mode compatibility, high-resolution images in different fields of view. The depth of field is large and the image is rich in stereo.
Features
Low Voltage
Carbon material samples with small penetration depth at low voltage. The real shape of the sample surface can be obtained with richer details.
The electron beam irradiation damage of the hair sample is reduced at low voltage while the charge effect is eliminated.
Low Vacuum
Filtered fiber tube materials are poorly conductive and charge significantly in high vacuum. In the low vacuum, direct observation of non-conductive samples can be achieved without coating.
Biological samples, using a large field of view observation, can easily obtain the overall morphology and head structure details of ladybugs, showing cross-scale analysis.