SEM3200 Tungsten Filament Scanning Electron Microscope

Manufacturer: CIQTEK

Product Code: SEM3200

 

SKU: EA-111017-789

Description

SEM3200 Tungsten Filament Scanning Electron Microscope

Description of  SEM3200 Tungsten Filament Scanning Electron Microscope

CIQTEK SEM3200 is a high-performance tungsten filament scanning electron microscope. It has excellent image quality, low vacuum mode compatibility, high-resolution images in different fields of view. The depth of field is large and the image is rich in stereo.

Features

 Low Voltage

Carbon material samples with small penetration depth at low voltage. The real shape of the sample surface can be obtained with richer details.

The electron beam irradiation damage of the hair sample is reduced at low voltage while the charge effect is eliminated.

 Low Vacuum

Filtered fiber tube materials are poorly conductive and charge significantly in high vacuum. In the low vacuum, direct observation of non-conductive samples can be achieved without coating.

 Large Field of View

Biological samples, using a large field of view observation, can easily obtain the overall morphology and head structure details of ladybugs, showing cross-scale analysis.