Tungsten Filament Scanning Electron Microscope SEM2000
Manufacturer: CIQTEK
Product Code: SEM2000
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Description
Tungsten Filament Scanning Electron Microscope SEM2000
Description of Tungsten Filament Scanning Electron Microscope SEM2000
The CIQTEK SEM2000 is a basic and versatile analytical tungsten filament scanning electron microscope with 20 kV resolution up to 3.9 nm and support for upgrading to 30 kV, allowing observation of microstructural information of sub-microscale samples.
It has a larger range of motion than a desktop / benchtop SEM and is suitable for rapid screening of samples, and has more expansion interfaces for BSED, EDS/EDX, and other accessories to enable a wider range of applications.
Features
- Optical Navigation
Easy to navigate by clicking where you want to see.
Standard optical navigation camera for high-definition sample stage photos and quick sample positioning.
- Anti-collision
More novice-friendly anti-collision design for maximum protection of sensitive units.
- One-Click Imaging
*The software is easy to operate with one-click imaging.
- Working Distance
The optimal analysis distance and image distance are two in one to easily experience quality performance.
